Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii
Naturalized populations of Epidendrum L. are found on a rocky hillside in Nuuanu-Pali and Olomana in the Koolau Mountains of Oahu, Hawaii. Scanning electron micrographs were taken to observe polymorphism among the pollinia, petals, leaves, and root tips of two Epidendrum specimens (one naturalized s...
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Formato: | Online |
Idioma: | eng |
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Universidad de Costa Rica
2013
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Acceso en línea: | https://revistas.ucr.ac.cr/index.php/lankesteriana/article/view/11548 |
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LANKESTERIANA11548 |
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record_format |
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institution |
Universidad de Costa Rica |
collection |
Lankesteriana: International Journal on Orchidology |
language |
eng |
format |
Online |
author |
White, Ingelia P. Fay, Michael F. Porter, Brad W. Chinen, Kimberley |
spellingShingle |
White, Ingelia P. Fay, Michael F. Porter, Brad W. Chinen, Kimberley Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii |
author_facet |
White, Ingelia P. Fay, Michael F. Porter, Brad W. Chinen, Kimberley |
author_sort |
White, Ingelia P. |
description |
Naturalized populations of Epidendrum L. are found on a rocky hillside in Nuuanu-Pali and Olomana in the Koolau Mountains of Oahu, Hawaii. Scanning electron micrographs were taken to observe polymorphism among the pollinia, petals, leaves, and root tips of two Epidendrum specimens (one naturalized specimen from Nuuanu-Pali and one cultivated specimen in the greenhouse). SEM images of pollen from the naturalized Epidendrum revealed a length of 830.31 μm and a width of 462.58 μm. Pollen length from the cultivated cultivar, by comparison, was 724.60 μm and the width 276.17 μm. Differing cell structures on the lower surface of the petals were also observed. Polyhedral concave cells with numerous fossae (pits) were seen on the naturalized cultivar and elongated flattened cells on the cultivated one. Transections of the leaf of the naturalized specimen were much thinner (546.33 μm) compared to the thickness of the cultivated cultivar leaf (1505.83 μm), which contained more spongy parenchyma cells. A thinner root tip (1094.19 μm) was seen in the naturalized cultivar, as opposed to 1636.34 μm in the cultivated specimen. To compare relationships between these two specimens along with ten other unknown Epidendrum cultivars, we sequenced the plastid trnL-F gene region and conducted parsimony analysis among the naturalized Epidendrum from Nuuanu-Pali At least six changes separated these specimens into two clades. Shorter and longer plastid simple sequence repeats (cpSSR) from the rps16-trnK region support separation of the five Epidendrum genotypes evaluated into these two groups, including a naturalized Epidendrum from Olomana. |
title |
Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii |
title_short |
Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii |
title_full |
Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii |
title_fullStr |
Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii |
title_full_unstemmed |
Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii |
title_sort |
sem and phylogenetic analysis of naturalized and cultivated epidendrum in hawaii |
title_alt |
Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii |
publisher |
Universidad de Costa Rica |
publishDate |
2013 |
url |
https://revistas.ucr.ac.cr/index.php/lankesteriana/article/view/11548 |
work_keys_str_mv |
AT whiteingeliap semandphylogeneticanalysisofnaturalizedandcultivatedepidendruminhawaii AT faymichaelf semandphylogeneticanalysisofnaturalizedandcultivatedepidendruminhawaii AT porterbradw semandphylogeneticanalysisofnaturalizedandcultivatedepidendruminhawaii AT chinenkimberley semandphylogeneticanalysisofnaturalizedandcultivatedepidendruminhawaii |
_version_ |
1810112899760259072 |
spelling |
LANKESTERIANA115482022-07-20T00:57:04Z Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii Sem and phylogenetic analysis of naturalized and cultivated Epidendrum in Hawaii White, Ingelia P. Fay, Michael F. Porter, Brad W. Chinen, Kimberley epidendrum scanning electron microscopy trnl-f rps16-trnk epidendrum scanning electron microscopy trnl-f rps16-trnk Naturalized populations of Epidendrum L. are found on a rocky hillside in Nuuanu-Pali and Olomana in the Koolau Mountains of Oahu, Hawaii. Scanning electron micrographs were taken to observe polymorphism among the pollinia, petals, leaves, and root tips of two Epidendrum specimens (one naturalized specimen from Nuuanu-Pali and one cultivated specimen in the greenhouse). SEM images of pollen from the naturalized Epidendrum revealed a length of 830.31 μm and a width of 462.58 μm. Pollen length from the cultivated cultivar, by comparison, was 724.60 μm and the width 276.17 μm. Differing cell structures on the lower surface of the petals were also observed. Polyhedral concave cells with numerous fossae (pits) were seen on the naturalized cultivar and elongated flattened cells on the cultivated one. Transections of the leaf of the naturalized specimen were much thinner (546.33 μm) compared to the thickness of the cultivated cultivar leaf (1505.83 μm), which contained more spongy parenchyma cells. A thinner root tip (1094.19 μm) was seen in the naturalized cultivar, as opposed to 1636.34 μm in the cultivated specimen. To compare relationships between these two specimens along with ten other unknown Epidendrum cultivars, we sequenced the plastid trnL-F gene region and conducted parsimony analysis among the naturalized Epidendrum from Nuuanu-Pali At least six changes separated these specimens into two clades. Shorter and longer plastid simple sequence repeats (cpSSR) from the rps16-trnK region support separation of the five Epidendrum genotypes evaluated into these two groups, including a naturalized Epidendrum from Olomana. Naturalized populations of Epidendrum L. are found on a rocky hillside in Nuuanu-Pali and Olomana in the Koolau Mountains of Oahu, Hawaii. Scanning electron micrographs were taken to observe polymorphism among the pollinia, petals, leaves, and root tips of two Epidendrum specimens (one naturalized specimen from Nuuanu-Pali and one cultivated specimen in the greenhouse). SEM images of pollen from the naturalized Epidendrum revealed a length of 830.31 μm and a width of 462.58 μm. Pollen length from the cultivated cultivar, by comparison, was 724.60 μm and the width 276.17 μm. Differing cell structures on the lower surface of the petals were also observed. Polyhedral concave cells with numerous fossae (pits) were seen on the naturalized cultivar and elongated flattened cells on the cultivated one. Transections of the leaf of the naturalized specimen were much thinner (546.33 μm) compared to the thickness of the cultivated cultivar leaf (1505.83 μm), which contained more spongy parenchyma cells. A thinner root tip (1094.19 μm) was seen in the naturalized cultivar, as opposed to 1636.34 μm in the cultivated specimen. To compare relationships between these two specimens along with ten other unknown Epidendrum cultivars, we sequenced the plastid trnL-F gene region and conducted parsimony analysis among the naturalized Epidendrum from Nuuanu-Pali At least six changes separated these specimens into two clades. Shorter and longer plastid simple sequence repeats (cpSSR) from the rps16-trnK region support separation of the five Epidendrum genotypes evaluated into these two groups, including a naturalized Epidendrum from Olomana. Universidad de Costa Rica 2013-08-11 info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion Article application/pdf https://revistas.ucr.ac.cr/index.php/lankesteriana/article/view/11548 10.15517/lank.v0i0.11548 Lankesteriana: International Journal on Orchidology; 2013: Lankesteriana: Volumen 13, Número 1-2 Lankesteriana: International Journal on Orchidology; 2013: Lankesteriana: Volumen 13, Número 1-2 2215-2067 1409-3871 eng https://revistas.ucr.ac.cr/index.php/lankesteriana/article/view/11548/10893 |